Data dimensionality reduction for neural based classification of optical surfaces defects

Abstract

A major step for high-quality optical surfaces faults diagnosis concerns scratches and digs defects characterization in products. This challenging operation is very important since it is directly linked with the produced optical component’s quality. A classification phase is mandatory to complete optical devices diagnosis since a number of correctable defects are usually present beside the potential “abiding” ones. Unfortunately relevant data extracted from raw image during defects detection phase are high dimensional. This can have harmful effect on the behaviors of artificial neural networks which are suitable to perform such a challenging classification. Reducing data dimension to a smaller value can decrease the problems related to high dimensionality. In this paper we compare different techniques which permit dimensionality reduction and evaluate their impact on classification tasks performances.